- Dual-view imaging
- High-resolution images with 24-bit color
- Enhanced material discrimination
- Windows Operating System with Intel® Core™ Processor
- Real-time diagnostics
- High-contrast image analysis
The XIS-6545DV™ is an advanced X-Ray Inspection System (XIS) designed for dual-view x-ray screening. Its powerful dual generators provide upward and diagonal viewing angles of screened objects. Each view can be manipulated independently, allowing operators to perform rapid and in-depth inspections while simultaneously using different screening modes.
With Astrophysics’ best-in-class imaging software, the XIS-6545DV™ allows operators to inspect objects with colorful, high-contrast filters and identify materials, recognize objects, and isolate threats with increased speed and accuracy.
65.7 cm x 45.1 cm (25.9" x 17.8")
213.3 cm (84.0")
101.6 cm (40.0")
129.0 cm (50.8")
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