XIS-6545DV

XIS-6545DV

PRODUCT HIGHLIGHTS

  • Dual-view imaging
  • High-resolution images with 24-bit color
  • Enhanced material discrimination
  • Windows Operating System with Intel® Core™ Processor
  • Real-time diagnostics
  • High-contrast image analysis

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iso certified
ISO 9001: CERTIFIED

PRODUCT INFORMATION

The XIS-6545DV™ is an advanced X-Ray Inspection System (XIS) designed for dual-view x-ray screening. Its powerful dual generators provide upward and diagonal viewing angles of screened objects. Each view can be manipulated independently, allowing operators to perform rapid and in-depth inspections while simultaneously using different screening modes.

With Astrophysics’ best-in-class imaging software, the XIS-6545DV™ allows operators to inspect objects with colorful, high-contrast filters and identify materials, recognize objects, and isolate threats with increased speed and accuracy.

Specifications

Generator:

Dual 180kV

Tunnel Size:

65.7 cm x 45.1 cm (25.8" x 17.7")

Length:

213.3 cm (83.97")

Width:

101.6 cm (40.0")

Height:

129.0 cm (50.81")

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