- Dual-view imaging
- High-resolution images with 24-bit color
- Enhanced material discrimination
- Windows Operating System with Intel® Core™ Processor
- Real-time diagnostics
- High-contrast image analysis
The XIS-6545DVS™ is an advanced X-Ray Inspection System (XIS) designed with dual imaging generators, allowing operators to examine objects from multiple angles simultaneously. This reduces potential blind spots and obstructions for operators, and each view can be reviewed independently using Astrophysics’ multi-colored, high-contrast screening software.
The system’s high-quality imaging enables higher throughput, meaning operators spend less time resolving false alarms and conducting manual inspections.
65.0 cm x 45.1 cm (25.6" x 17.8")
204.0 cm (80.3")
128.3 cm (50.5")
135.0 cm (53.1")
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