XIS-7858DVS™
PRODUCT HIGHLIGHTS
- Minimal footprint
- Dual-view imaging
- High-resolution images with 24-bit color
- Enhanced material discrimination
- Windows Operating System with Intel® Core™ Processor
- Real-time Diagnostics
- High-contrast image analysis
The XIS-7858DVS™ is a dual-view X-Ray Inspection System (XIS) with a small footprint, designed for screening small- to moderately-sized objects in confined locations. Its dual-imaging system delivers two views of scanned objects, allowing operators to manipulate each view independently and examine objects in multiple screening modes simultaneously.
Utilizing Astrophysics’ best-in-class imaging software, the XIS-7858DVS™ allows operators to make quick and thorough inspections of complex bags and parcels. Its superior imaging ensures higher throughput, making it the ideal solution for high-traffic security checkpoints.
Dual 180kV
77.8 cm x 57.9 cm (30.6" x 22.8")
259.7 cm (102.2")
134.6 cm (53.0")
147.3 cm (58.0")
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