- Compact, narrow footprint
- High-resolution images with 24-bit color
- Enhanced material discrimination
- Windows Operating System with Intel® Core™ Processor
- Real-time diagnostics
- High-contrast image analysis
The XIS-6545N™ is a compact X-Ray Inspection System (XIS) with a narrow frame and wide tunnel designed to screen a wide range of objects at checkpoints while operating in tight locations. Featuring Astrophysics’ best-in-class imaging technology, it allows operators to analyze objects in high-definition color with sharp contrast. This helps them discriminate between different materials and quickly locate threats with increased accuracy.
The XIS-6545N™ is the ideal solution for security missions that demand power and flexibility in locations not normally suited for larger systems.
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