- Compact, narrow footprint
- High-resolution images with 24-bit color
- Enhanced material discrimination
- Windows Operating System with Intel® Core™ Processor
- Real-time diagnostics
- High-contrast image analysis
The XIS-6545N™ is a compact X-Ray Inspection System (XIS) with a narrow frame and wide tunnel designed to screen a wide range of objects at checkpoints while operating in tight locations. Featuring Astrophysics’ best-in-class imaging technology, it allows operators to analyze objects in high-definition color with sharp contrast. This helps them discriminate between different materials and quickly locate threats with increased accuracy.
The XIS-6545N™ is the ideal solution for security missions that demand power and flexibility in locations not normally suited for larger systems.
62.0 cm x 45.0 cm (24.4" x 17.7")
153.4 cm (60.4")
83.7 cm (32.9")
130.5 cm (51.4")
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