XIS-6545N

XIS-6545N

PRODUCT HIGHLIGHTS

  • Compact, narrow footprint
  • High-resolution images with 24-bit color
  • Enhanced material discrimination
  • Windows Operating System with Intel® Core™ Processor
  • Real-time diagnostics
  • High-contrast image analysis

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iso certified
ISO 9001: CERTIFIED

PRODUCT INFORMATION

The XIS-6545N™ is a compact X-Ray Inspection System (XIS) with a narrow frame and wide tunnel designed to screen a wide range of objects at checkpoints while operating in tight locations. Featuring Astrophysics’ best-in-class imaging technology, it allows operators to analyze objects in high-definition color with sharp contrast. This helps them discriminate between different materials and quickly locate threats with increased accuracy.

The XIS-6545N™ is the ideal solution for security missions that demand power and flexibility in locations not normally suited for larger systems.

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